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tm - Technisches Messen

Plattform für Methoden, Systeme und Anwendungen der Messtechnik

[TM - Technical Measurement: A Platform for Methods, Systems, and Applications of Measurement Technology
]

Editor-in-Chief: Puente León, Fernando / Zagar, Bernhard

12 Issues per year


IMPACT FACTOR 2016: 0.348

CiteScore 2016: 0.28

SCImago Journal Rank (SJR) 2016: 0.241
Source Normalized Impact per Paper (SNIP) 2016: 0.343

486,00 € / $656.00 / £364.00*

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ISSN
0171-8096
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Issues

Overview

tm - technisches messen is proud to announce a new feature, the Editor’s Choice free access article. To download the featured article free of charge, please click the link below.

Vol. 84, Supplement 1: XXXI. Messtechnisches Symposium 2017

Vol. 84, Iss. 5: Sensors, instrumentation and measurement science for "Industrie 4.0"/ Sensorik und Messtechnik für die Industrie 4.0 by Andreas Schütze and Nikolai Helwig

Vol. 84, Iss. 5: Sensor information as a service – Component of the networked production/ Sensorinformationen als Dienst – Baustein der vernetzten Produktion by Robert H. Schmitt and Christoph Voigtmann

Vol. 84, Iss. 3: Viscoelasticity and anisotropy of polymers: ultrasonic based method for material parameter determination by Fabian Bause, Leander Claes, Manuel Webersen, Sarah Johannesmann and Bern Henning

Vol. 83, Iss. 12: Vergleichsproben aus Silizium für die Flächenrauheit by Joachim Frühauf, Eva Gärtner, Ludger Koenders and Andre Felgner

Vol. 83, Iss. 12: Downstream relaxation of velocity profiles in pipe-flow with swirl disturbances by Simon Graner, Denis F. Hinz and Christian Breitsamter

Vol. 83, Iss. 10: Inline imaging-ellipsometer for printed electronics by Florian Huemer, Murad Jamalieh, Ferndinand Bammer and Dirk Hönig

Vol. 83, Iss. 10: Setup of a large-scale test field for distributed soil gas sensors and testing of a monitoring method based on tomography by Patrick P. Neumann, Klaus-Dieter Werner, Sergej Petrov and Detlef Lazik

Vol. 83, Iss. 9: Creating precise reference data for 3D head pose estimation by Sebastian Vater, Johannes Pallauf, Marian Hoffman, Thorsten Stein and Fernando Puente León

Vol. 83, Iss. 1: Noise equalisation and quasi loss-less image data compression – or how many bits needs an image sensor? by Bernd Jähne and Martin Schwarzbauer

Your benefits

  • Professional journal for application-based industrial measurement as one of the essential components of automation, process monitoring, quality control and safety engineering
  • Official organ of AMA (The Association for Sensor Technology) and NAMUR (The Process-Industry Interest Group for Automation Technology)
  • Includes notifications from GMA (The VDI/VDE Society for Measurement and Automatic Control)
  • Renowned Editorial Board
  • High-quality contributions
  • Special issues
  • Print- and online-publication

Aims and Scope

Objective

The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them.

Topics

  • The manufacture and characteristics of new sensors for measurement technology in the industrial sector
  • New measurement methods
  • Hardware and software based processing and analysis of measurement signals to obtain measurement values
  • The outcomes of employing new measurement systems and methods

Details

OLDENBOURG WISSENSCHAFTSVERLAG
Language:
German, English
Type of Publication:
Journal
Readership:

developers, manufacturers, measurement technologists

Submission of Manuscripts

Instructions for Authors

Article formats

Research articles

Your benefits of publishing with us

Submission

You can easily submit your manuscript online. Simply go to...

http://mc.manuscriptcentral.com/teme

...and you will be guided through the whole peer-reviewing and publishing process.

Submission process

Please note

We look forward to receiving your manuscript!

Hybrid Open Access

For complete details on hybrid open access publishing at De Gruyter please see: https://www.degruyter.com/page/560

Effective 1st January 2016, authors from an institution affiliated with either the Association of Dutch Universities (VSNU), the Consortium of Swiss Academic Libraries or some UK libraries participating in the Jisc Collections SMP  may publish primary research and review articles open access in any of De Gruyter’s OnlineOpen journals at a discount of 90% of the APC price. For more information and to confirm whether your institution is eligible please see the following:

The Netherlands: https://www.degruyter.com/page/1461
The UK: https://www.degruyter.com/page/1462
Switzerland:  https://www.degruyter.com/page/1463

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History

tm – technisches messen was founded in 1931.

Abstracting & Indexing

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Editorial Information

Editor

Prof. Dr.-Ing. F. Puente León, Karlsruhe
Prof. Dr.-Ing. B. Zagar, Linz

Editorial Board

Prof. Dr.-Ing. J. Beyerer, Karlsruhe
Prof. Dr.-Ing. J. Czarske, Dresden
Prof. Dr.-Ing. G. Fischerauer, Bayreuth
Prof. Dr. Th. Fröhlich, Ilmenau
Prof. Dr. G. Gerlach, Dresden
Prof. Dr.-Ing. M. Heizmann, Karlsruhe
Dr.-Ing. F. Höller, Carl Zeiss AG, Oberkochen
Prof. Dr. techn. Dr.-Ing. M. Kaltenbacher, Wien
Prof. Dr.-Ing. O. Kanoun, Chemnitz
Prof. Dr. M. Kreutzbruck, Stuttgart
Prof. Dr.-Ing. R. Lerch, Erlangen
Prof. Dr. R. Z. Morawski, Warschau
Dr. T. Pechstein, Waldheim
Prof.-Ing. P. Ripka, Prag
Prof. Dr.-Ing. K.-D. Sommer, Ilmenau
Prof. Dr. R. Tutsch, Braunschweig
Prof. Dr. R. Werthschützky, Darmstadt


Journal Manager

DE GRUYTER
Genthiner Strasse 13
10785 Berlin, Germany
+49 30.260 05-344
ulrike.kitzing[at]degruyter.com

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