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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Boldyreva, Elena V. / Friese, Karen / Huppertz, Hubert / Jahn, Sandro / Tiekink, E. R. T.

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Volume 148, Issue 3-4

Issues

Refinement of the structures of GeS, GeSe, SnS and SnSe

Heribert Wiedemeier / Hans Georg von Schnering
Published Online: 2010-08-25 | DOI: https://doi.org/10.1524/zkri.1978.148.3-4.295

Abstract

The orthorhombic structures (Pbnm-D[unk]; No. 62) of GeS, GeSe, SnS and SnSe have been refined (X-ray diffractometer data: 319 hkl, R = 0.029; 370 hkl, R = 0.061; 386 hkl, R = 0.062; 506 hkl, R = 0.076). The bond distances are: Ge—S = 2.438(1), 2.448(2) Å; Ge—Se = 2.574(2), 2.564(3) Å; Sn—S = 2.665(2), 2.627(4) Å; Sn— Se = 2.793(2), 2.744(3) Å. The structures of these compounds reveal systematic variations of bond lengths, bond angles and of non-bonding distances. These properties as well as their temperature dependence compared to those of related compounds allow to treat these structures as different configurations of a hypothetical reaction path of a phase transition GeS type → TlI type → NaCl type.

About the article

Published Online: 2010-08-25

Published in Print: 1978


Citation Information: Zeitschrift für Kristallographie, Volume 148, Issue 3-4, Pages 295–303, ISSN (Online) 0044-2968, ISSN (Print) 1433-7266, DOI: https://doi.org/10.1524/zkri.1978.148.3-4.295.

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