Abstract
A method for measuring piezoelectric constants by a dynamic method operating at frequencies of about 3 – 5kHz is described. It is characterized by simple handling and evaluation of the piezoelectric constants dijk and their sign, high accuracy (<1%) and the possibility of piezoelectric measurements on semiinsulating (ϱ ≥ 109Ω cm) crystals. The method is based on the inverse piezoelectric effect. The piezoelectrically induced deformation of the test crystal is detected by a piezoelectric ceramic and compared with that of a standard crystal (α-quartz). Piezoelectric coefficients of some substances are redetermined. Values for the dijk of CdTe and N2H5LiSO4 are given.
© 2015 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München