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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Friese, Karen / Huppertz, Hubert / Tiekink, E. R. T.

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IMPACT FACTOR 2017: 1.263
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2196-7105
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Volume 220, Issue 12

Issues

Problems in measuring diffuse X-ray scattering

T. Richard Welberry / Darren J. Goossens
  • 1 The Austrian National University, Research School of Chemistry, Canberra 0200, Australien
  • Other articles by this author:
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/ Aidan P. Heerdegen
  • 2 The Australian National University, Research School of Chemistry, Canberra 0200, Australien
  • Other articles by this author:
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/ Peter L. Lee
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/zkri.2005.220.12.1052

Abstract

Problems encountered in making measurements of diffuse X-ray scattering are discussed. These generally arise from the need to measure very weak scattering in the presence of very strong scattering (Bragg peaks) using multi-detectors of various kinds. The problems are not confined to synchrotron experiments but may even occur using a tube source in the home laboratory. Specific details are given of experiments using 80.725 keV X-rays and a mar345 Image Plate detector on the 1-ID beamline of XOR at the Advanced Photon Source. In these a severe ‘blooming’ artefact which occurred around some strong Bragg peaks was traced to fluorescence from a steel mounting plate in the detector when strong Bragg peaks were incident. Algorithms developed to remove these artefacts from the data are described.

About the article

* Correspondence address: The Australian National University, Research School of Chemistry, Canberra 0200, Australien,


Published Online: 2009-09-25

Published in Print: 2005-12-01


Citation Information: Zeitschrift für Kristallographie - Crystalline Materials, Volume 220, Issue 12, Pages 1052–1058, ISSN (Online) 2196-7105, ISSN (Print) 2194-4946, DOI: https://doi.org/10.1524/zkri.2005.220.12.1052.

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M. Paściak, T. R. Welberry, J. Kulda, S. Leoni, and J. Hlinka
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[4]
R. E. Whitfield, D. J. Goossens, A. J. Studer, and J. S. Forrester
Metallurgical and Materials Transactions A, 2012, Volume 43, Number 5, Page 1423

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