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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

12 Issues per year


IMPACT FACTOR 2016: 3.179

CiteScore 2016: 3.30

SCImago Journal Rank (SJR) 2016: 1.097
Source Normalized Impact per Paper (SNIP) 2016: 2.592

Online
ISSN
2196-7105
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Volume 220, Issue 8 (Aug 2005)

Issues

On the nanostructure of radiation-amorphized zircon and pyrochlores: a small-angle x-ray scattering study

Susana Ríos / Christopher M. Martin / Karl R. Whittle
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/zkri.220.8.748.67082

Abstract

Nanoscale structural features of amorphous zircon and pyrochlore produced by self-irradiation induced amorphization have been characterized by small-angle X-ray scattering (SAXS). Electron density fluctuations were observed in the untreated samples and studied as a function of annealing temperature (up to 1300 °C). In untreated zircon, density fluctuations were found to have a characteristic length-scale of approximately 1 nanometer diameter. A clear scattering maximum develops at ∼3 nm–1 as a function of the degree of damage, but only for amorphous fractions higher than 70%. For the untreated pyrochlore sample such a strong signal was not observed in the scattering function. As annealing temperature increases, phase segregation is observed in zircon with a clear nucleation at 850 °C of zirconia grains. The SAXS contribution, however, points towards a lower nucleation temperature, ca. 700 °C. In the pyrochlore structure, at temperatures as low as 300 °C the appearance of a first crystalline phase, Ca2Nb2O7, is observed, with the subsequent crystallization of TiO2 at 800 °C. Observed electron density variations are compared between the two structures and discussed in terms of nanoscale phase segregation phenomena.

About the article

Received: June 30, 2004

Accepted: September 15, 2004

Published Online: 2009-09-25

Published in Print: 2005-08-01


Citation Information: Zeitschrift für Kristallographie - Crystalline Materials, ISSN (Online) 2196-7105, ISSN (Print) 2194-4946, DOI: https://doi.org/10.1524/zkri.220.8.748.67082.

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