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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

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Structural fingerprinting in the transmission electron microscope: overview and opportunities to implement enhanced strategies for nanocrystal identification

Peter Moeck / Philip Fraundorf
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/zkri.2007.222.11.634

This paper illustrates the prospective need for structural fingerprinting methods for nanocrystals. A review of the existing fingerprinting methods for crystal structures by means of transmission electron microscopy (TEM) which work for a single setting of the specimen goniometer is given. Suggestions are made on how some of these methods could be enhanced when nanocrystals and novel instrumentation are involved, i.e. when either the kinematic or quasi-kinematic scattering approximations are sufficiently well satisfied. A novel strategy for lattice-fringe fingerprinting of nanocrystals from Fourier transforms of high-resolution phase contrast transmission electron microscopy (HRTEM) images is briefly outlined. Nanocrystal structure specific limitations to the application of this strategy are discussed.

Keywords: Transmission electron microscopy; Structural fingerprinting; Nanocrystals; Structural databases

About the article

Received: 2007-04-23

Accepted: 2007-06-13

Published Online: 2009-09-25

Published in Print: 2007-11-01

Citation Information: Zeitschrift für Kristallographie - Crystalline Materials, ISSN (Online) 2196-7105, ISSN (Print) 2194-4946, DOI: https://doi.org/10.1524/zkri.2007.222.11.634. Export Citation

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P. Moeck, S. Rouvimov, E. F. Rauch, M. Véron, H. Kirmse, I. Häusler, W. Neumann, D. Bultreys, Y. Maniette, and S. Nicolopoulos
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