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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Boldyreva, Elena V. / Friese, Karen / Huppertz, Hubert / Jahn, Sandro / Tiekink, E. R. T.

IMPACT FACTOR 2018: 1.090
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CiteScore 2018: 1.47

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Volume 222, Issue 7


High temperature structural behaviour of Li2VOSiO4

Michele Zema / Serena C. Tarantino / Paolo Ghigna / Gabriele Montagna
Published Online: 2009-09-25 | DOI: https://doi.org/10.1524/zkri.2007.222.7.350

Structural investigations at high temperature were carried out on compound Li2VOSiO4, which crystallises with a natisite-type structure. Unit-cell parameters were measured and diffracted intensities collected at regular intervals in the temperature range 25–500 °C using single crystal X-ray diffraction techniques. Thermal expansion coefficients showed positive expansion of lattice constants, greater along the c direction, and of cell volume. Reversibility of thermal expansion in the investigated temperature range was checked by measuring unit-cell parameters after the crystal was cooled down from 500 °C to room temperature. Structure refinements revealed that the [VOSi4]n2− layers are almost rigid and that the most relevant modifications occur at the intercalated ion layer.

Keywords: X-ray diffraction; Single crystal structure analysis; Thermal expansion; Natisite

About the article

Received: 2006-11-14

Accepted: 2007-02-15

Published Online: 2009-09-25

Published in Print: 2007-07-01

Citation Information: Zeitschrift für Kristallographie, Volume 222, Issue 7, Pages 350–355, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2007.222.7.350.

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