Jump to ContentJump to Main Navigation
Show Summary Details

Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

12 Issues per year

IMPACT FACTOR increased in 2015: 2.560
Rank 8 out of 26 in category Cristallography in the 2015 Thomson Reuters Journal Citation Report/Science Edition

SCImago Journal Rank (SJR) 2015: 0.827
Source Normalized Impact per Paper (SNIP) 2015: 1.198
Impact per Publication (IPP) 2015: 1.834

See all formats and pricing
Volume 225, Issue 12 (Dec 2010)


Instrumental profile of MYTHEN detector in Debye-Scherrer geometry

Fabia Gozzo / A. Cervellino
  • 1 Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz
/ Matteo Leoni
  • 2 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien
/ Paolo Scardi
  • 3 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien
/ A. Bergamaschi
  • 4 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz
/ B. Schmitt
  • 5 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz
Published Online: 2010-10-13 | DOI: https://doi.org/10.1524/zkri.2010.1345


The main aberrations affecting data collected with 1D position sensitive detectors in Debye-Scherrer capillary geometry are examined, and analytical corrections proposed. The equations are implemented in two of the most advanced software based on the Rietveld and Whole Powder Pattern Modelling methods, respectively, for structure and microstructure analysis. Application to MYTHEN, a fast single photon counting detector developed at the Swiss Light Source, is discussed in detail.

Keywords: Instrumental line profile; Profile aberrations; Synchrotron radiation XRPD; Debye-Scherrer geometry; Position sensitive detector

About the article

* Correspondence address: Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz,

Published Online: 2010-10-13

Published in Print: 2010-12-01

Citation Information: Zeitschrift für Kristallographie Crystalline Materials, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2010.1345. Export Citation

Citing Articles

Here you can find all Crossref-listed publications in which this article is cited. If you would like to receive automatic email messages as soon as this article is cited in other publications, simply activate the “Citation Alert” on the top of this page.

Rong Du, Quan Cai, Zhongjun Chen, Yu Gong, Hong Liu, and Zhonghua Wu
Instrumentation Science & Technology, 2015, Page 150615132829004
Luca Rebuffi, Jasper R. Plaisier, Mahmoud Abdellatief, Andrea Lausi, and Paolo Scardi
Zeitschrift für anorganische und allgemeine Chemie, 2014, Volume 640, Number 15, Page 3100
Larissa S. Bernardi, Fábio F. Ferreira, Silvia L. Cuffini, Carlos E.M. Campos, Gustavo A. Monti, Gislaine Kuminek, Paulo R. Oliveira, and Simone G. Cardoso
Talanta, 2013, Volume 117, Page 189
P. R. Willmott, D. Meister, S. J. Leake, M. Lange, A. Bergamaschi, M. Böge, M. Calvi, C. Cancellieri, N. Casati, A. Cervellino, Q. Chen, C. David, U. Flechsig, F. Gozzo, B. Henrich, S. Jäggi-Spielmann, B. Jakob, I. Kalichava, P. Karvinen, J. Krempasky, A. Lüdeke, R. Lüscher, S. Maag, C. Quitmann, M. L. Reinle-Schmitt, T. Schmidt, B. Schmitt, A. Streun, I. Vartiainen, M. Vitins, X. Wang, and R. Wullschleger
Journal of Synchrotron Radiation, 2013, Volume 20, Number 5, Page 667
S. Van Petegem, J. Zimmermann, S. Brandstetter, X. Sauvage, M. Legros, and H. Van Swygenhoven
Acta Materialia, 2013, Volume 61, Number 15, Page 5835
Stephen P. Thompson, Julia E. Parker, Julien Marchal, Jonathan Potter, Adrian Birt, Fajin Yuan, Richard D. Fearn, Alistair R. Lennie, Steven R. Street, and Chiu C. Tang
Journal of Synchrotron Radiation, 2011, Volume 18, Number 4, Page 637

Comments (0)

Please log in or register to comment.
Log in