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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

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Volume 225, Issue 12 (Dec 2010)

Issues

Instrumental profile of MYTHEN detector in Debye-Scherrer geometry

Fabia Gozzo / A. Cervellino
  • 1 Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz
/ Matteo Leoni
  • 2 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien
/ Paolo Scardi
  • 3 University of Trento, Department of Materials Engineering and Industrial, Trento, Italien
/ A. Bergamaschi
  • 4 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz
/ B. Schmitt
  • 5 Paul Scherrer Institut, Swiss Light Source, Villigen PSI, Schweiz
Published Online: 2010-10-13 | DOI: https://doi.org/10.1524/zkri.2010.1345

Abstract

The main aberrations affecting data collected with 1D position sensitive detectors in Debye-Scherrer capillary geometry are examined, and analytical corrections proposed. The equations are implemented in two of the most advanced software based on the Rietveld and Whole Powder Pattern Modelling methods, respectively, for structure and microstructure analysis. Application to MYTHEN, a fast single photon counting detector developed at the Swiss Light Source, is discussed in detail.

Keywords: Instrumental line profile; Profile aberrations; Synchrotron radiation XRPD; Debye-Scherrer geometry; Position sensitive detector

About the article

* Correspondence address: Paul Scherrer Institute, Swiss Light Source, Villigen PSI, Schweiz,


Published Online: 2010-10-13

Published in Print: 2010-12-01


Citation Information: Zeitschrift für Kristallographie Crystalline Materials, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2010.1345. Export Citation

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