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Zeitschrift für Kristallographie - Crystalline Materials

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Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction

Edgar F. Rauch / Joaquin Portillo
  • 1 NanoMEGAS SPRL, Brussels, Belgien
/ Stavros Nicolopoulos
  • 2 NanoMEGAS SPRL, Saint Jean Molenbeek, Brussels, Belgien
/ Daniel Bultreys
  • 3 NanoMEGAS SPRL, Saint Jean Molenbeek, Brussels, Belgien
/ Sergei Rouvimov
  • 4 University de Barcelona, SERVEIS Cientificotecnics, Barcelona, Spanien
/ Peter Moeck
  • 5 Portland State University, Department of Physics, Portland, Oregon, U.S.A.
Published Online: 2010-04-16 | DOI: https://doi.org/10.1524/zkri.2010.1205


An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.

Keywords: Nanocrystals; Orientation mapping; Structural mapping; Structural fingerprinting; Structural databases

About the article

* Correspondence address: CNRS-Grenoble INP, SIMAP/GPM2 laboratory, rue de la Physique, 38402 Saint Martin d'Hères, Frankreich,

Published Online: 2010-04-16

Published in Print: 2010-03-01

Citation Information: Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2010.1205. Export Citation

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