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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

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Volume 226, Issue 2 (Feb 2011)


Temperature-dependent synchrotron powder diffraction phase studies of (K0.37Na0.52Li0.03)(Nb0.87Ta0.1Sb0.03)O3 ferroelectric ceramics

Henry Mgbemere / Rodrigo P. Fernandes
  • 1 Hamburg University of Technology, Institute of Advanced Ceramics, Hamburg, Deutschland
/ Manuel Hinterstein
  • 2 TU Dresden, Institute for Complex Materials, Dresden, Deutschland
/ Gerold A. Schneider
  • 3 Hamburg University of Technology, Institute of Advanced Ceramics, Hamburg, Deutschland
Published Online: 2010-11-24 | DOI: https://doi.org/10.1524/zkri.2011.1298


Temperature-dependent synchrotron powder diffraction measurements have been performed on lead-free ferroelectric (K0.37Na0.52Li0.03)(Nb0.87Ta0.1Sb0.03)O3 ceäramics. The measurement was performed from 20 °C to 400 °C with 20 °C steps. The diffraction patterns showed the existence of two phases from 20 °C to 180 °C while the ferroelectric to paraelectric phase transition occurred between 340 °C and 360 °C. Rietveld refinement using the Fullprof software was employed and the two-phase region was refined using a combination of the orthorhombic phase with space group Amm2 (38) and the tetragonal phase with space group P4mm (99) from 20 °C to 180 °C. The tetragonal phase was used for the refinement up to 340 °C while the cubic phase was refined with space group Pm-3m (221). Good refinement structure parameters were obtained for all temperatures with the average G.O.F being approximately 4.0. Information about the cell parameters and weight fraction of the phases were obtained as a function of temperature.

Keywords: Synchrotron X-ray; Rietveld refinement; Lead-free ferroelectric ceramics; Potassium sodium niobate; High temperature

About the article

* Correspondence address: Hamburg University of Technology, Institute of Advanced Ceramics, Denickestraße 15, 21073 Hamburg, Deutschland,

Published Online: 2010-11-24

Published in Print: 2011-02-01

Citation Information: Zeitschrift für Kristallographie Crystalline Materials, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2011.1298.

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© by Oldenbourg Wissenschaftsverlag, Hamburg, Germany. Copyright Clearance Center

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