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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

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IMPACT FACTOR 2016: 3.179

CiteScore 2016: 3.30

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Volume 227, Issue 5 (May 2012)


Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

A. M. Milinda Abeykoon / Christos D. Malliakas / Pavol Juhás
  • 2 Columbia University, Department of Applied Physics and Applied Mathemat, New York 10027, U.S.A.
  • Other articles by this author:
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/ Emil S. Bozin
  • 3 Brookhaven National Laboratory, Condensed Matter Physics and Materials Science Dep, Upton, NY 11973, U.S.A.
  • Other articles by this author:
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/ Mercouri G. Kanatzidis / Simon J. L. Billinge
  • 5 Columbia University, Department of Applied Physics and Applied Mathemat, New York 10027, U.S.A.
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Published Online: 2012-03-22 | DOI: https://doi.org/10.1524/zkri.2012.1510


Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

Keywords: pair distribution function; electron diffraction; nanomaterials; diffraction; polycrystalline films

About the article

* Correspondence address: Brookhaven National Laboratory, Condensed Matter Physics and Materials Science Dep, P.O. Box 5000, Upton, NY 11973, U.S.A.,

Published Online: 2012-03-22

Published in Print: 2012-05-01

Citation Information: Zeitschrift für Kristallographie Crystalline Materials, ISSN (Print) 0044-2968, DOI: https://doi.org/10.1524/zkri.2012.1510.

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© by Oldenbourg Wissenschaftsverlag, Upton, NY 11973, Germany. Copyright Clearance Center

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