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Zeitschrift für Kristallographie - Crystalline Materials

Editor-in-Chief: Pöttgen, Rainer

Ed. by Antipov, Evgeny / Bismayer, Ulrich / Boldyreva, Elena V. / Huppertz, Hubert / Petrícek, Václav / Tiekink, E. R. T.

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Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

A. M. Milinda Abeykoon* / Christos D. Malliakas1 / Pavol Juhás2 / Emil S. Bozin3 / Mercouri G. Kanatzidis4 / Simon J. L. Billinge5

1 Northwestern University, Department of Chemistry, Evanston, IL 60208, U.S.A.

2 Columbia University, Department of Applied Physics and Applied Mathemat, New York 10027, U.S.A.

3 Brookhaven National Laboratory, Condensed Matter Physics and Materials Science Dep, Upton, NY 11973, U.S.A.

4 Northwestern University, Department of Chemistry, Evanston, IL 60208, U.S.A.

5 Columbia University, Department of Applied Physics and Applied Mathemat, New York 10027, U.S.A.

* Correspondence address: Brookhaven National Laboratory, Condensed Matter Physics and Materials Science Dep, P.O. Box 5000, Upton, NY 11973, U.S.A.,

Citation Information: Zeitschrift für Kristallographie Crystalline Materials. Volume 227, Issue 5, Pages 248–256, ISSN (Print) 0044-2968, DOI: 10.1524/zkri.2012.1510, March 2012

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Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

Keywords: pair distribution function; electron diffraction; nanomaterials; diffraction; polycrystalline films

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