Jump to ContentJump to Main Navigation
Show Summary Details
More options …

Zeitschrift für Naturforschung A

A Journal of Physical Sciences

Editor-in-Chief: Holthaus, Martin

Editorial Board: Fetecau, Corina / Kiefer, Claus

12 Issues per year


IMPACT FACTOR 2016: 1.432

CiteScore 2017: 1.30

SCImago Journal Rank (SJR) 2017: 0.403
Source Normalized Impact per Paper (SNIP) 2017: 0.632

Online
ISSN
1865-7109
See all formats and pricing
More options …
Volume 21, Issue 12

Issues

Zur Bestimmung des Fano-Faktors von Ge(Li)-Detektoren

Ingolf Ruge / Peter Eichinger
Published Online: 2014-06-02 | DOI: https://doi.org/10.1515/zna-1966-1212

Within the last two years the FANO factor F for Ge (Li)-detectors, which defines the theoretical limit for the resolution in the area of spectroscopy in regard to the detector, was found out experimentally several times. The values obtained for F vary between 0.7 and 0.15. In order to find out the reasons for these variations the dependence of the energy resolution on the electric field was examined at various gamma-energies for several Ge (Li)-detectors. Even at very high electric fields (several kilovolts/cm) still a field dependence especially at high gamma-energies appeared, which could be explained in terms of charge collection time. As condition for an exact determination of the FANO factor the extrapolation of the resolution to field strength infinity is set up; with this method the value of the FANO factor for Ge (Li)-detectors, used here, was estimated to 0.20 ±0.05.

About the article

Received: 1966-09-05

Published Online: 2014-06-02

Published in Print: 1966-12-01


Citation Information: Zeitschrift für Naturforschung A, Volume 21, Issue 12, Pages 2083–2088, ISSN (Online) 1865-7109, ISSN (Print) 0932-0784, DOI: https://doi.org/10.1515/zna-1966-1212.

Export Citation

© 1946 – 2014: Verlag der Zeitschrift für Naturforschung. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License. BY-NC-ND 3.0

Comments (0)

Please log in or register to comment.
Log in