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BY-NC-ND 3.0 license Open Access Published by De Gruyter June 2, 2014

Reaction Time to Voltage Pulses Applied to Semiconductor Impact Ionization Breakdown

  • A. Kittel , U. Rau , M. Hirsch , R. Richter , R. P. Huebener , J. Peinke and J. Parisi

Abstract

The electric avalanche breakdown in semiconductors exhibits many features of a phase transition. In this paper, we introduce time-resolved measurements performed during the transition from a low to a high conducting state as reaction to a sudden change of the control parameter (i.e., the voltage bias).

Received: 1993-2-16
Published Online: 2014-6-2
Published in Print: 1993-6-1

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This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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