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BY-NC-ND 3.0 license Open Access Published by De Gruyter June 2, 2014

Considerations of image contrast in Electron Microscopy of objects composed of low atomic number

  • M. L. De

Defects of the electron scattering formula based on Thomas-Fermi atom model and of Lei segang's formula, are first briefly discussed in relation to image contrast problem in Electron Microscopy. A few aspects of the electron scattering formula of Lenz are then considered particularly for dealing with elements of low atomic number. From a consideration of this formula it is shown that the image contrast of a given mass thickness of object is liable to be dependent on the atomic number of the object.

Received: 1962-3-17
Published Online: 2014-6-2
Published in Print: 1962-11-1

© 1946 – 2014: Verlag der Zeitschrift für Naturforschung

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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