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Founded in 1887

Zeitschrift für Physikalische Chemie

International journal of research in physical chemistry and chemical physics

Ed. by Rademann, Klaus


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Structural Features at the Si — SiO2 Interface*

Keith L. Brower

1Sandia National Laboratories, Albuquerque, New Mexico 87185-5800, United States of America

Citation Information: Zeitschrift für Physikalische Chemie. Volume 151, Issue Part_1_2, Pages 177–189, ISSN (Print) 0942-9352, DOI: 10.1524/zpch.1987.151.Part_1_2.177, August 2011

Publication History

Published Online:
2011-08-30

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Jason P. Campbell, Patrick M. Lenahan, Corey J. Cochrane, Anand T. Krishnan, and Srikanth Krishnan
IEEE Transactions on Device and Materials Reliability, 2007, Volume 7, Number 4, Page 540
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A. Stesmans and G. Van Gorp
Physical Review B, 1989, Volume 39, Number 4, Page 2864
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K. L. Brower
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[9]
K. L. Brower
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J. P. Campbell, P. M. Lenahan, A. T. Krishnan, and S. Krishnan
Applied Physics Letters, 2007, Volume 91, Number 13, Page 133507
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A. Stesmans and V. V. Afanas’ev
Journal of Applied Physics, 1998, Volume 83, Number 5, Page 2449
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J. P. Campbell, P. M. Lenahan, A. T. Krishnan, and S. Krishnan
Applied Physics Letters, 2005, Volume 87, Number 20, Page 204106
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V. Lang, J. D. Murphy, R. J. Falster, and J. J. L. Morton
Journal of Applied Physics, 2012, Volume 111, Number 1, Page 013710
[17]
Giacomo Martini
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Arthur H. Edwards and W. Beall Fowler
Microelectronics Reliability, 1999, Volume 39, Number 1, Page 3
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J.H. Stathis, S. Rigo, and I. Trimaille
Solid State Communications, 1991, Volume 79, Number 2, Page 119
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