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Zeitschrift für Physikalische Chemie

International journal of research in physical chemistry and chemical physics

Editor-in-Chief: Rademann, Klaus


IMPACT FACTOR 2018: 0.975
5-year IMPACT FACTOR: 1.021

CiteScore 2018: 1.20

SCImago Journal Rank (SJR) 2018: 0.327
Source Normalized Impact per Paper (SNIP) 2018: 0.391

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2196-7156
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Volume 230, Issue 3

Issues

Anomalous X-ray Scattering on Semiconducting Glasses at ESRF: Review in Recent Fifteen Years

Shinya Hosokawa
  • Corresponding author
  • Department of Physics, Graduate School of Science and Technology, Kumamoto University, 2-39-1 Kurokami, Chuo-ku, Kumamoto, 860-8555, Japan
  • Department of Chemistry, Physical Chemistry, Philipps University of Marburg, Hans-Meerwein-Str., Marburg, 35032, Germany
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/ Jens Rüdiger Stellhorn
  • Department of Chemistry, Physical Chemistry, Philipps University of Marburg, Hans-Meerwein-Str., Marburg, 35032, Germany
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/ Wolf-Christian Pilgrim
  • Department of Chemistry, Physical Chemistry, Philipps University of Marburg, Hans-Meerwein-Str., Marburg, 35032, Germany
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/ Jean-François Bérar
  • Institut Néel, CNRS/Université Joseph Fourier, 25 rue des Martyrs, BP 166, Grenoble cedex 9, 38042, France
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Published Online: 2015-11-13 | DOI: https://doi.org/10.1515/zpch-2015-0653

Abstract

The most difficult issue for the structural characterizations for non-crystalline multi-component materials is to determine partial structures because n(n + 1)/2 scattering experiments with different scattering cross-sections are necessary for n-component materials. More than three decades have already passed through since anomalous X-ray scattering (AXS) using synchrotron radiation (SR) was expected as a promising tool for investigating partial structures. Compared with a related method, X-ray absorption fine structure, however, AXS is still rarely used owing to difficulties in the experiments and data analyses. We have developed a new detecting system, which can fully utilize intense X-ray fluxes from third-generation SR facilities. Using this detecting system, we have carried out many AXS experiments at the beamline BM02 of the ESRF on several semiconducting glasses. The obtained differential structure factors were analyzed using reverse Monte Carlo modeling to draw three-dimensional atomic configurations. In this article, we review results of semiconducting glasses, and describe the structure-property relations in these glasses.

Keywords: Atomic Structure; Non-Crystalline Materials; Partial Structure; Synchrotron Radiation; Chalcogenide Glasses

About the article

Accepted: 2015-10-25

Received: 2014-06-29

Published Online: 2015-11-13

Published in Print: 2016-03-28


Citation Information: Zeitschrift für Physikalische Chemie, Volume 230, Issue 3, Pages 313–338, ISSN (Online) 2196-7156, ISSN (Print) 0942-9352, DOI: https://doi.org/10.1515/zpch-2015-0653.

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