Spectral Line Shapes
6–11 June 2010
St. John’s, Newfoundland, Canada
The 20th International Conference on Spectral Line Shapes (ICSLS 20) will be held 6–11 June 2010 on the St. John’s campus of the Memorial University of Newfoundland, St. John’s, Newfoundland, Canada.
This biennial conference is a principal international forum for both fundamental and applied works dealing with processes related to the formation of the spectral line profiles and their use for diagnostic purposes. On the fundamental side, the study of the line profiles reveals the underlying atomic and molecular interactions. On the practical side, the line profiles are employed as powerful diagnostic tools for various media, such as neutral gases, technological gas discharges, magnetically confined plasmas for fusion, laser– and Z—pinch-produced plasmas, astrophysical plasmas, and planetary atmospheres.
The ICSLS conferences, which started in 1973 in Paris, France, alternates between Europe and US/Canada. The previous conference was held in Valladolid, Spain, in 2008.
See Mark Your Calendar for contact information.
Page last modified 28 January 2010.
Copyright © 2003-2009 International Union of Pure and Applied Chemistry.
Questions regarding the website, please contact firstname.lastname@example.org