Trap-assisted tunnelling current in MIM structures

Juraj Racko 1 , Miroslav Mikolášek 1 , Ralf Granzner 2 , Juraj Breza 1 , Daniel Donoval 1 , Alena Grmanová 1 , Ladislav Harmatha 1 , Frank Schwierz 2 , and Karol Fröhlich 3
  • 1 Slovak University of Technology, Ilkovičova 3, 812 19, Bratislava, Slovakia
  • 2 Technical University of Ilmenau, PF 98684, Ilmenau, Germany
  • 3 Slovak Academy of Sciences, Dúbravská cesta 9, 841 04, Bratislava, Slovakia

Abstract

A new model is presented of current transport in Metal Insulator Metal (MIM) structures by quantum mechanical tunnelling. In addition to direct tunnelling through an insulating layer, tunnelling via defects present in the insulating layer plays an important role. Examples of the influence of the material and thickness of the insulating layer, energy distribution of traps, and metal work functions are also provided.

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