Secondary electron microscopy and transmission electron microscopy studies of carbon nanotubes in C-Ni films

Mirosław Kozłowski 1 , Piotr Dłużewski 2 , Ewa Kowalska 1 , and Elżbieta Czerwosz 1
  • 1 Tele & Radio Research Institute, ul. Ratuszowa 11, 03-450, Warszawa, Poland
  • 2 Institute of Physics PAS, Al. Lotników 32/46, 02-668, Warszawa, Poland

Abstract

Carbon nanotubes films have been studied with SEM and TEM. The studied films were obtained using a two step method: PVD process and CVD process. Strongly defected and curled carbon nanotubes containing Ni nanoparticles formed the film with thickness of about 300–400 nm. Observed carbon nanotubes were of lengths from 100 nm to 300 nm and did not stick to each other.

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