The dispersion of the thermal plane waves (phonons) in crystals can be determined from the x-ray diffraction intensity distribution around a reciprocal lattice point. In the method presented here no higher-order phonon-scattering corrections are necessary. It is shown furthermore that polarizations and dispersion of the phonons can be determined from the intensity distributions around six properly chosen reciprocal lattice points.
Zeitschrift für Kristallographie – Crystalline Materials offers a place for researchers to present results of their crystallographic studies. The journal includes theoretical as well as experimental research. It publishes Original Papers, Letters and Review Articles in manifold areas of crystallography.