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Eggersglüß, Stephan / Fey, Görschwin / Polian, Ilia

Test digitaler Schaltkreise

[Testing Digital Circuits]

DE GRUYTER OLDENBOURG

    64,95 € / $91.00 / £58.99*

    eBook (PDF)
    Publication Date:
    February 2014
    Copyright year:
    2014
    ISBN
    978-3-486-72014-3
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    Overview

    Aims and Scope

    Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing – and this aim must be achieved at low cost, since every chip has to be tested separately after production.

    Details

    x, 228 pages
    DE GRUYTER OLDENBOURG
    Language:
    German
    Type of Publication:
    Monograph
    Keyword(s):
    Digital circuit testing; testing; digital circuits
    Readership:
    Master’s level students of computer science and electrical engineering.

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