Eggersglüß, Stephan / Fey, Görschwin / Polian, Ilia
Test digitaler Schaltkreise
[Testing Digital Circuits]
Aims and Scope
Embedded systems are assuming key control functions in everyday life. Systemic failure in the energy supply or the transport sector could lead to fatal consequences. Users place great reliance on the error-free function of such systems. Guaranteeing the functional capability of digital circuits is the goal of testing – and this aim must be achieved at low cost, since every chip has to be tested separately after production.
- x, 228 pages
- DE GRUYTER OLDENBOURG
- Type of Publication:
- Digital circuit testing; testing; digital circuits
- Master’s level students of computer science and electrical engineering.